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GaN Systems Upcoming Webinar Illustrates the Insignificant Effects of Dynamic Rds(on) to overall System Losses

OTTAWA, Ontario, Canada, May 14, 2019 – GaN Systems announces an upcoming webinar on Thursday, May 16th at 11:00 AM Eastern Daylight Time titled: The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications.

GaN power transistors are the building blocks of change for the design of a new generation of smaller, lower cost, more efficient power systems – free from the limitations of yesterday’s silicon. Over the past several years, power engineers have demonstrated that systems designed with GaN power transistors exhibit high efficiency and power density due to GaN’s superior switching performance. One characteristic that continues to draw attention from academia and industry is dynamic RDS(on) performance of GaN devices.

In this one-time only webinar, the following topics will be discussed:

  • The testing methods suggested to establish GaN’s reliability and effective.
  • Quantitative analysis of RDS(on) 
  • Conduction loss equation is analyzed
  • A system-level loss breakdown is conducted
  • Conclusion: Dynamic RDS(on) is not a significant loss factor in power system design.

Speaking at the webinar is Dr. Ruoyu (Roy) Hou. Dr. Hou is a Power Electronics Application Engineer at GaN Systems. He received his M.S. degree from the Illinois Institute of Technology, Chicago, IL, USA and his Ph.D. degree from the McMaster University, Hamilton, ON, Canada, both in electrical engineering.

Formerly an electrical engineer with GE Transportation, Dr. Hou was a post-doctoral research fellow at McMaster Automotive Resource Centre (MARC), a Canada-based Excellence Research Center.

Dr. Hou was a recipient of the ECCE Best Paper Award in 2016 and a co-recipient of the Chrysler Innovation Award for the Automotive Partnership Canada (APC) project in 2014.

The moderator for the webinar is Jason Lomberg, North American editor for Power Systems Design.

To register for the GaN Systems webinar, please click here.

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About GaN Systems

GaN Systems is the global leader in GaN power semiconductors with the largest portfolio of transistors that uniquely address the needs of today’s most demanding industries including data center servers, renewable energy systems, automotive, industrial motors and consumer electronics.

As a market-leading innovator, GaN Systems makes possible the design of smaller, lower cost, more efficient power systems. The company’s award-winning products provide system design opportunities free from the limitations of yesterday’s silicon. By changing the rules of transistor performance, GaN Systems is enabling power conversion companies to revolutionize their industries and transform the world. For more information, please visit: www.gansystems.com or on Facebook, Twitter and LinkedIn.


Media Inquiries:

Mary Placido

Trier and Company

mary@triercompany.com

+1 (415) 218-3627


Key Takeaways
  • GaN Systems is holding a webinar on Thursday, May 16th at 11:00 AM EDT titled, The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications
  • Topics discussed include GaN reliability testing methods and quantitative analysis of RDS(on)
  • Presenter is Dr.  Ruoyu (Roy) Hou, Power Electronics Application Engineer at GaN Systems
Contacts
Mary Placido
mary@triercompany.com
4152183627
Media Contact - Trier and Company for GaN Systems